AFM / SPM Nanoscale Characterization
Configuration: MZ-Active or MZ-Balance; optionally paired with MZ-Solid
Tailored for AFM and SPM platforms, configuring isolation and rigid supports according to axis sensitivity and installation conditions.
Typical Application Scenarios & Configurations
Dedicated solutions for AFM, optical metrology, laser beamlines, and high-sensitivity tools, integrating testing, isolation, and re-test verification.
Optical Surface Profiler
Configuration: MZ-Active Desktop; or MZ-Station for complete workcell
Eliminates low-frequency floor disturbances for surface profiling and 3D optical topography metrology.
Nanoindentation Systems
Configuration: MZ-Active Desktop
Suppresses ambient fluctuations during micromechanical testing to maintain an ultra-stable force-displacement baseline.
Nanotechnology Equipment
Configuration: MZ-Station, optionally integrating MZ-Active modules
Integrates vibration isolation, high-rigidity structural support, and operational space into a unified cleanroom workstation.
Super-Resolution Microscopy
Configuration: MZ-Station Imaging, integratable with MZ-Active
Resolves multi-axis vibration-induced image blur and focal drift during extended exposures and high-magnification acquisitions.
Optical Path Setups
Configuration: MZ-Optic; optionally paired with MZ-Shield
Provides honeycomb optical breadboards with tuned damping, complemented by acoustic enclosures as required.